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Measurement of wedge angle of a transparent parallel plate using quasi-monochromatic light source and phase shifting interferometry

机译:用准单色光源和相移干涉法测量透明平行板的楔角

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摘要

A new technique (to our knowledge), for the measurement of residual wedge angle (RWA) of high optical quality transparent nearly parallel plate (PP), using a quasi-monochromatic light source, is presented. Advantages and drawbacks of the technique and the results obtained for a PP, using a filtered white light source, is discussed. A slightly modified optical setup for accurate determination of RWA, using phase shifting interferometry (PSI), has been described. Results obtained, applying PSI, for a validation experiment and for the determination of RWA of a quasi-PP is presented. The PSI based technique does not suffer from any measurement ambiguities due to limitation in effective beam aperture. Hence the technique is suitable for high accuracy measurement of RWA of PP. In both the optical setups, presented in this paper, the respective interfering beams travel the same optical circuit and are thus subject to same perturbation in optical path, due to external mechanical vibration, which finally cancels out. Thus the measurements are much less affected by external vibrations. Since the respective interfering beams undergo identical reflections and transmissions, the visibility or contrast of the interference fringes is very good.
机译:提出了一种新技术(据我们所知),该技术使用准单色光源测量高光学质量的透明近平行平板(PP)的残留楔角(RWA)。讨论了该技术的优缺点和使用滤波后的白光源获得的PP的结果。已经描述了使用相移干涉术(PSI)进行稍微修改的光学装置,以准确确定RWA。介绍了使用PSI获得的结果,用于验证实验和准PP的RWA的测定。由于有效光束孔径的限制,基于PSI的技术不会遭受任何测量歧义。因此,该技术适合于PP RWA的高精度测量。在本文介绍的两种光学装置中,由于外部机械振动,各自的干涉光束在同一光路中传播,因此在光路上受到相同的干扰,最终被抵消。因此,测量受到外部振动的影响要小得多。由于各个干涉光束经历相同的反射和透射,因此干涉条纹的可见度或对比度非常好。

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