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Measurement of displacement using phase shifted wedge plate lateral shearing interferometry

机译:使用相移楔形板横向剪切干涉法测量位移

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摘要

In present communication, a simple technique for measurement of displacement using phase shifted wedge plate lateral shearing interferometry is described. The light beam from laser is expanded and illuminates a wedge plate of relatively large angle. Light transmitted through the wedge plate is converged onto a reflecting specimen using a focusing lens. Back-reflected wavefront from the specimen is incident on the wedge plate. Because of the tilt and shear of the wavefront reflected from the wedge plate, typical straight line fringes appear. These fringes are superimposed onto a sinusoidal grating forming a moire pattern. The orientation of the moire fringes is a function of specimen displacement. Four step phase shifting test procedure has been incorporated by translating the grating in phase steps of pi/2. Necessary mathematical formulation to establish correlation between the 'difference phase' and the displacement of the specimen surface is undertaken. The technique is automatic and provides resolution and expanded uncertainty of 1 mu m and 0.246 mu m, respectively. Detailed uncertainty analysis is also reported. (C) 2015 Elsevier Ltd. All rights reserved.
机译:在当前的通信中,描述了一种使用相移楔形板横向剪切干涉术测量位移的简单技术。来自激光的光束被扩展并照亮相对较大角度的楔形板。通过楔形板透射的光使用聚焦透镜会聚到反射样品上。样本的向后反射波前入射在楔形板上。由于从楔形板反射的波前的倾斜和剪切,会出现典型的直线条纹。这些条纹叠加在形成莫尔条纹的正弦光栅上。莫尔条纹的方向是样品位移的函数。通过以pi / 2的相位步长平移光栅,已纳入了四步相移测试程序。进行必要的数学公式化,以建立“差异相”与试样表面位移之间的相关性。该技术是自动的,可提供1微米和0.246微米的分辨率和扩展的不确定度。还报告了详细的不确定性分析。 (C)2015 Elsevier Ltd.保留所有权利。

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