首页> 外文期刊>Langmuir: The ACS Journal of Surfaces and Colloids >Wet chemical functionalization of III-V semiconductor surfaces: Alkylation of gallium phosphide using a Grignard reaction sequence
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Wet chemical functionalization of III-V semiconductor surfaces: Alkylation of gallium phosphide using a Grignard reaction sequence

机译:III-V半导体表面的湿化学功能化:使用格氏反应序列对磷化镓进行烷基化

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摘要

Single-crystalline gallium phosphide (GaP) surfaces have been functionalized with alkyl groups via a sequential Cl-activation, Grignard reaction process. X-ray photoelectron (XP) spectra of freshly etched GaP(111)A surfaces demonstrated reproducible signals for surficial Cl after treatment with PCl_5 in chlorobenzene. The measured Cl content consistently corresponded to approximately a monolayer of coverage on GaP(111)A. In contrast, GaP(111)B surfaces treated with the same PCl_5 solution under the same conditions exhibited macroscale roughening and yielded XP spectra that showed irreproducible Cl surface content often below the limit of detection of the spectrometer. The Cl-activated GaP(111)A surfaces were reactive toward alkyl Grignard reagents. Sessile contact angle measurements between water and GaP(111)A after various levels of treatment showed that GaP(111)A surfaces became significantly more hydrophobic following reaction with either CH _3MgCl or C_(18)H_(37)MgCl. GaP(111)A surfaces reacted with C_(18)H_(37)MgCl demonstrated wetting properties consistent with surfaces modified with a dense layer of long alkyl chains. High-resolution C 1s XP spectra indicated that the carbonaceous species at GaP(111)A surfaces treated with Grignard reagents could not be ascribed solely to adventitious carbon. A shoulder in the C 1s XP spectra occurred at slightly lower binding energies for these samples, commensurate with the formation of Ga-C bonds. High-resolution P 2p XP spectra taken at various times during prolonged direct exposure to ambient laboratory air indicated that the resistance of GaP(111)A to surface oxidation was greatly enhanced after surface modification with alkyl groups. GaP(111)A samples that had been functionalized with C_(18)H_(37)- groups exhibited less than 0.1 nm of surface oxide after 7 weeks of continuous exposure to ambient air. GaP(111)A surfaces terminated with C_(18)H_(37)- groups were also used as platforms in Schottky heterojunctions with Hg. In comparison to freshly etched GaP(111)A, the alkyl-terminated GaP(111)A samples yielded current-voltage responses that were in accord with metal-insulator-semiconductor devices and indicated that this reaction strategy could be used to alter rates of heterogeneous charge transfer controllably. The wet chemical surface functionalization strategy described herein does not involve thiol/sulfide chemistry or gas-phase pretreatments and represents a new synthetic methodology for controlling the interfacial properties of GaP and related Ga-based III-V semiconductors.
机译:单晶磷化镓(GaP)表面已通过顺序的Cl活化Grignard反应过程被烷基官能化。新腐蚀的GaP(111)A表面的X射线光电子(XP)光谱表明,在氯苯中用PCl_5处理后,表面Cl的再现信号可再现。测得的Cl含量始终对应于GaP(111)A上大约一个单层覆盖。相反,在相同条件下用相同PCl_5溶液处理的GaP(111)B表面表现出宏观粗糙化,并产生XP光谱,该光谱显示出不可再现的Cl表面含量,通常低于光谱仪的检测极限。 Cl活化的GaP(111)A表面对烷基格氏试剂具有反应性。在经过不同程度的处理后,水与GaP(111)A之间的无接触角测量表明,与CH _3MgCl或C_(18)H_(37)MgCl反应后,GaP(111)A表面变得明显更疏水。与C_(18)H_(37)MgCl反应的GaP(111)A表面表现出与经长烷基链致密层修饰的表面一致的润湿性能。高分辨率的C 1s XP光谱表明,用格氏试剂处理过的GaP(111)A表面的碳质物种不能仅归因于不定碳。这些样品的C 1s XP光谱中的肩峰出现在结合能稍低的位置,与Ga-C键的形成相称。在长时间直接暴露于环境实验室空气中的不同时间拍摄的高分辨率P 2p XP光谱表明,在对烷基进行表面修饰后,GaP(111)A对表面氧化的抵抗力大大增强。在连续暴露于环境空气7周后,已被C_(18)H_(37)-功能化的GaP(111)A样品的表面氧化物小于0.1 nm。以C_(18)H_(37)-端基终止的GaP(111)A表面也用作带有Hg的肖特基异质结的平台。与新刻蚀的GaP(111)A相比,烷基封端的GaP(111)A样品产生的电流-电压响应与金属-绝缘体-半导体器件一致,表明该反应策略可用于改变硅的GaP(111)A速率。异质电荷转移可控。本文所述的湿化学表面功能化策略不涉及硫醇/硫化物化学或气相预处理,而是代表一种新的合成方法,用于控制GaP和相关的Ga基III-V半导体的界面性质。

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