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首页> 外文期刊>Nanotechnology >Correlation between the structural and optical properties of spontaneously formed GaN nanowires: a quantitative evaluation of the impact of nanowire coalescence
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Correlation between the structural and optical properties of spontaneously formed GaN nanowires: a quantitative evaluation of the impact of nanowire coalescence

机译:自发形成的GaN纳米线的结构和光学性质之间的相关性:纳米线聚结影响的定量评估

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摘要

We investigate the structural and optical properties of spontaneously formed GaN nanowires with different degrees of coalescence. This quantity is determined by an analysis of the crosssectional area and perimeter of the nanowires obtained by plan-view scanning electron microscopy. X-ray diffraction experiments are used to measure the inhomogeneous strain in the nanowire ensembles as well as the orientational distribution of the nanowires. The comparison of the results obtained for GaN nanowire ensembles prepared on bare Si(111) and AlN buffered 6H-SiC(0001~-) reveals that the main source of the inhomogeneous strain is the random distortions caused by the coalescence of adjacent nanowires. The magnitude of the strain inhomogeneity induced by nanowire coalescence is found not to be determined solely by the coalescence degree, but also by the mutual misorientation of the coalesced nanowires. The linewidth of the donor-bound exciton transition in photoluminescence spectra does not exhibit a monotonic increase with the coalescence degree. In contrast, the comparison of the root mean square strain with the linewidth of the donor-bound exciton transition reveals a clear correlation: the higher the strain inhomogeneity, the larger the linewidth.
机译:我们研究具有不同聚结程度的自发形成的GaN纳米线的结构和光学性质。通过分析通过平面扫描电子显微镜获得的纳米线的横截面积和周长来确定该量。 X射线衍射实验用于测量纳米线集合体中的不均匀应变以及纳米线的取向分布。对在裸露的Si(111)和AlN缓冲的6H-SiC(0001〜-)上制备的GaN纳米线集成体所获得的结果的比较表明,不均匀应变的主要来源是由相邻纳米线的聚结引起的随机变形。发现由纳米线聚结引起的应变不均匀性的大小不仅取决于聚结程度,而且还取决于聚结的纳米线的相互错位。在光致发光光谱中,施主结合的激子跃迁的线宽不随聚结度而单调增加。相反,均方根应变与供体结合的激子跃迁的线宽的比较显示出明显的相关性:应变不均匀性越高,线宽越大。

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