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On the physical properties of memristive, memcapacitive and meminductive systems

机译:关于忆阻,忆阻和忆磁系统的物理性质

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We discuss the physical properties of realistic memristive, memcapacitive and meminductive systems. In particular, by employing the well-known theory of response functions and microscopic derivations, we show that resistors, capacitors and inductors with memory emerge naturally in the response of systems - especially those of nanoscale dimensions - subjected to external perturbations. As a consequence, since memristances, memcapacitances and meminductances are simply response functions, they are not necessarily finite. This means that, unlike what has always been argued in some literature, diverging and non-crossing input-output curves of all these memory elements are physically possible in both quantum and classical regimes. For similar reasons, it is not surprising to find memcapacitances and meminductances that acquire negative values at certain times during dynamics, while the passivity criterion of memristive systems imposes always a non-negative value on the resistance at any given time. We finally show that ideal memristors, namely those whose state depends only on the charge that flows through them (or on the history of the voltage), are subject to very strict physical conditions and are unable to protect their memory state against the unavoidable fluctuations, and therefore are susceptible to a stochastic catastrophe. Similar considerations apply to ideal memcapacitors and meminductors.
机译:我们讨论了现实的忆阻,忆阻和忆阻系统的物理特性。特别是,通过使用众所周知的响应函数理论和微观推导,我们表明带有存储器的电阻器,电容器和电感器会在系统(尤其是纳米级尺寸的系统)的响应中受到自然干扰而自然出现。结果,由于忆阻,忆电容和忆阻仅仅是响应函数,因此它们不一定是有限的。这意味着,不同于某些文献中一直争论的那样,所有这些存储元件的输入-输出曲线的发散和非交叉在物理上都可能在量子和经典状态下发生。出于类似的原因,发现在动态过程中的某些时间处具有负值的微电容和磁导也就不足为奇了,而忆阻系统的无源性标准在任何给定时间总是将非负值强加给电阻。我们最终表明,理想的忆阻器,即状态仅取决于流过它们的电荷(或电压的历史)的记忆体,受到非常严格的物理条件的约束,无法保护其记忆状态免受不可避免的波动的影响,因此很容易发生随机灾难。类似的考虑也适用于理想的薄膜电容器和薄膜。

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