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Exploring carrier transport phenomena in a CVD-assembled graphene FET on hexagonal boron nitride

机译:探索在六方氮化硼上CVD组装的石墨烯FET中的载流子传输现象

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The supporting substrate plays a crucial role in preserving the superb electrical characteristics of an atomically thin 2D carbon system. We explore carrier transport behavior in a chemical-vapor-deposition- (CVD-) assembled graphene monolayer on hexagonal boron nitride (h-BN) substrate. Graphene-channel field-effect transistors (GFETs) were fabricated on ultra-thin h-BN multilayers to screen out carrier scattering from the underlying SiO _2 substrate. To explore the transport phenomena, we use three different approaches to extract carrier mobility, namely, effective carrier mobility (eff), intrinsic carrier mobility, and field-effect mobility (FE). A comparative study has been conducted based on the electrical characterization results, uncovering the impacts of supporting substrate material and device geometry scaling on carrier mobility in GFETs with CVD-assembled graphene as the active channel.
机译:支撑基板在保持原子薄的2D碳系统的卓越电特性方面起着至关重要的作用。我们探索六方氮化硼(h-BN)衬底上化学气相沉积(CVD)组装的石墨烯单层中的载流子传输行为。在超薄h-BN多层膜上制造了石墨烯沟道场效应晶体管(GFET),以从下面的SiO _2衬底中筛选出载流子散射。为了探索传输现象,我们使用三种不同的方法来提取载流子迁移率,即有效载流子迁移率(eff),固有载流子迁移率和场效应迁移率(FE)。基于电特性结果进行了比较研究,揭示了支持衬底材料和器件几何尺寸缩放对以CVD组装的石墨烯为有源沟道的GFET中载流子迁移率的影响。

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