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Achieving Ultrahigh Carrier Mobility in Two-Dimensional Hole Gas of Black Phosphorus

机译:在黑磷二维空穴气中实现超高载流子迁移率

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We demonstrate that a field-effect transistor (FET) made of few-layer black phosphorus (BP) encapsulated in hexagonal boron nitride (h-BN) in vacuum exhibits a room-temperature hole mobility of 5200 cm(2)/(Vs), being limited just by the phonon scattering. At cryogenic temperatures, the FET mobility increases up to 45 000 cm(2)/(Vs), which is five times higher compared to the mobility obtained in earlier reports. The unprecedentedly clean h-BN-BP-h-BN heterostructure exhibits Shubnikov-de Haas oscillations and a quantum Hall effect with Landau level (LL) filling factors down to v = 2 in conventional laboratory magnetic fields. Moreover, carrier density independent effective mass of m* = 0.26 m(0) is measured, and a Lande g-factor of g = 2.47 is reported. Furthermore, an indication for a distinct hole transport behavior with up- and down-spin orientations is found.
机译:我们证明了由真空中封装在六方氮化硼(h-BN)中的几层黑磷(BP)制成的场效应晶体管(FET)表现出5200 cm(2)/(Vs)的室温空穴迁移率,仅受声子散射的限制。在低温下,FET迁移率增加到45 000 cm(2)/(Vs),是早期报告中获得的迁移率的五倍。在传统实验室磁场中,前所未有的干净的h-BN-BP-h-BN异质结构表现出Shubnikov-de Haas振荡和量子霍尔效应,其Landau能级(LL)填充因子低至v = 2。此外,测量了独立于载流子密度的有效质量m * = 0.26 m(0),并且报道了Lande g因子g = 2.47。此外,还发现了具有向上和向下旋转方向的独特空穴传输行为的指示。

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