首页> 外文期刊>Colloid journal >The Formation of Submonolayer Thorium Coatings on a Silicon Oxide Surface by Electrochemical Deposition
【24h】

The Formation of Submonolayer Thorium Coatings on a Silicon Oxide Surface by Electrochemical Deposition

机译:电化学沉积在氧化硅表面形成亚单层Thor涂层

获取原文
获取原文并翻译 | 示例
           

摘要

Data are reported on the mechanisms of the formation of submonolayer coatings based on thorium oxide on the surface of Si(111) single crystal with natural oxide as a result of electrochemical deposition. It is experimentally shown that the deposition of thorium atoms from an acetone solution of Th(NO_3)_4 onto the surface of natural silicon oxide leads to the formation of defects in the thin silicon oxide layer, which is accompanied by the deposition of thorium nanoclusters onto a pure silicon surface. The observed effects have been qualitatively explained assuming the breakdown of natural silicon oxide due to the presence of an electrical double layer in the near-surface region of the cathode.
机译:关于电化学沉积的结果,报道了在具有天然氧化物的Si(111)单晶表面上基于氧化oxide形成亚sub涂层的机理的数据。实验表明,Th原子从Th(NO_3)_4的丙酮溶液中沉积到天然氧化硅的表面上会导致在薄氧化硅层中形成缺陷,并伴随着nano纳米团簇的沉积。纯硅表面。假定由于在阴极的近表面区域中存在双电层而导致天然氧化硅击穿,定性解释了观察到的效果。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号