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首页> 外文期刊>Angewandte Chemie >Facile Chemical Solution Deposition of High-Mobility Epitaxial Germanium Films on Silicon
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Facile Chemical Solution Deposition of High-Mobility Epitaxial Germanium Films on Silicon

机译:硅上高迁移率外延锗膜的简便化学溶液沉积

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摘要

The high carrier mobility and large absorption coefficient at near-infrared wavelengths make germanium one of the most attractive semiconductor materials for a wide range of applications. For example, the small band gap makes Ge a candidate for photodetectors and modulators at wavelengths in the range 1.3-1.6 μm. The high carrier mobility makes Ge the choice for high-speed transistors, which have potential applications in computers and switching systems. For many applications, the growth of Ge on Si is necessary. Different techniques have been used to grow Ge films on Si sub-strates. Unfortunately, the large capital investment, complicated processes, and a relatively small area coating have limited wide applications of these systems. Moreover, a thick buffer layer is generally required if a relaxed epitaxial Ge film is grown on Si.
机译:高载流子迁移率和在近红外波长处的大吸收系数使锗成为广泛应用中最具吸引力的半导体材料之一。例如,小带隙使Ge成为波长在1.3-1.6μm范围内的光电探测器和调制器的候选者。高载流子迁移率使Ge成为高速晶体管的选择,这些晶体管在计算机和交换系统中具有潜在的应用。对于许多应用,必须在Si上生长Ge。已经使用不同的技术在Si基板上生长Ge膜。不幸的是,大量的资本投资,复杂的工艺以及相对较小的涂层限制了这些系统的广泛应用。而且,如果在Si上生长松弛的外延Ge膜,通常需要厚的缓冲层。

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