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In Situ Magnetic Field-Assisted Low Temperature Atmospheric Growth of GaN Nanowires via the Vapor-Liquid-Solid Mechanism

机译:GaN纳米线的原位磁场辅助低温汽相生长

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摘要

We report the growth of GaN nanowires at a low temperature of 750 °C and at atmospheric pressure in a conventional chemical vapor deposition (CVD) setup via the vapor-liquid-solid mechanism with remarkable control of directionality and growth behavior by using an in situ magnetic field. Under typical growth conditions, without any magnetic field, the nanowires are severely twisted and kinked, and exhibit a high density of planar stacking defects. With increasing in situ magnetic field strength, the microstructural defects are found to decrease progressively, and quasi-aligned nanowires are produced. At an applied magnetic field strength of 0.80 T, near-vertical aligned straight and several micrometers long nanowires of average diameter of ~40 nm with defect-free microstructure are routinely produced. Photoluminescence measurements show that the relative intensity of the defect-related peaks in the visible region with respect to the near-band-edge emission continuously decrease with increase in the applied in situ magnetic field strength, ascribable to the magnetic field-assisted significant structural improvement of the wires. It is found out that the degree of agglomerative Ni droplet on Si is critically influenced by the surface tension driven by the magnetic force, which in turn determines the eventual properties of the nanowires.
机译:我们报告了GaN纳米线在750°C的低温和大气压下在常规化学气相沉积(CVD)装置中通过气液固机理的生长,并通过使用原位显着控制方向性和生长行为磁场。在典型的生长条件下,没有任何磁场,纳米线会严重扭曲和扭结,并表现出高密度的平面堆叠缺陷。随着原位磁场强度的增加,发现微观结构缺陷逐渐减少,并产生准取向的纳米线。在施加的磁场强度为0.80 T的情况下,通常会生产出近垂直排列的笔直和几微米长的纳米线,平均直径约为40 nm,具有无缺陷的微观结构。光致发光测量表明,随着施加的原位磁场强度的增加,可见光区域中与缺陷相关的峰的相对强度相对于近带边缘发射的相对强度持续降低,这归因于磁场辅助的显着结构改进的电线。已经发现,在硅上的Ni小滴的聚集程度受到磁力驱动的表面张力的关键影响,这反过来又决定了纳米线的最终性能。

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