...
首页> 外文期刊>表面科学 >Machining and Processing Technologies and Quality of Silicon Wafer Surfaces
【24h】

Machining and Processing Technologies and Quality of Silicon Wafer Surfaces

机译:硅晶片表面加工技术与质量

获取原文
获取原文并翻译 | 示例

摘要

The current state of the technologies of machining and processing of silicon wafers is described. The 8 inches diameter wafer process is just shifting to the process for 12 inches wafers. Actually, in wafer plants it is necessary to reconsider the wafer making methods which have been used so far. For instance, the method of wafer slicing is changing to multi-wire lapping from grinding with inner type thin diamond wheels, since the preparation of thinner and wider wheel metal plates becomes impossible for prospective large diameter silicon wafers. In wafer surface finishing, the present lapping and polishing methods will he replaced with a kind of grinding method using abrasive wheels as in glass lens manufacturing. However it might not become realistic soon, and, for the time being, the current conditions of lapping and chem-mechanical polishing will he utilized. The stock removing mechanism and the damaged layer in lapping or polishing are given an account.
机译:描述了硅晶片的机械加工技术的现状。直径为8英寸的晶圆工艺正转变为12英寸晶圆的工艺。实际上,在晶片工厂中,有必要重新考虑迄今为止使用的晶片制造方法。例如,晶片切片的方法正从使用内部薄型金刚石砂轮的研磨转变成多线研磨,因为对于预期的大直径硅晶片而言,制备更薄和更宽的砂轮金属板变得不可能。在晶片表面精加工中,当前的研磨和抛光方法将代替玻璃透镜制造中使用砂轮的一种研磨方法。但是,它可能不会很快成为现实,并且暂时将使用研磨和化学机械抛光的当前条件。说明了去毛刺机理和研磨或抛光中的受损层。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号