Interpretation of TEM Images of Impurities in Electrodeposited Films

摘要

Impurity inclusions in electrodepositedfilms can be imaged using a transmission electronmicroscope. Phase contrast by defocusing is used todetect small impurity molecules directly, whereasamplitude (diffraction) contrast is applied to imagesmall strain fields associated with impurityinclusions. Principles of the phase/diffractioncontrast for this application are described togetherwith applications to several experimental results frommicrostructural studies on electrode-posited films.