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Micromechanical modelling of SnAgCu solder joint under cyclic loading: Effect of grain orientation

机译:循环载荷下SnAgCu焊点的微力学建模:晶粒取向的影响

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摘要

Miniaturisation of SnAgCu solder joints for electronic package results in the diminishment of the number of grains within a single joint, sometimes down to only one or two grains per joint. In this case, solder joints exhibit an anisotropic creep behaviour. Moreover, the crystal structure of P Sri (matrix of SnAgCu eutectics and Sn dendrites) is a contracted version of a diamond cubic, one leading to a body-centred tetragonal structure, which enhances this non-uniform character. These factors affect the character of creep and consequently determine reliability of solder joints for electronic packages. In this study, a crystal visco-plasticity model is developed to capture an anisotropic behaviour of SnAgCu solder joints in cases of single-, bi- and multi-crystals. In order to simulate responses of solder joints under thermal cycling, a multi-scale finite element modelling is performed. In a global model, responses of joints in a flip chip package are simulated. Then results for displacements are adopted in the sub-model of a single joint. The obtained results are compared with those based on the traditional isotropic constitutive descriptions. (c) 2006 Elsevier B.V. All rights reserved.
机译:用于电子封装的SnAgCu焊点的小型化导致单个接点内晶粒数量的减少,有时每个接缝只能减少一到两个晶粒。在这种情况下,焊点表现出各向异性的蠕变行为。此外,P Sri的晶体结构(SnAgCu共晶和Sn树突的矩阵)是金刚石立方的收缩形式,其导致以人体为中心的四方结构,从而增强了这种非均匀性。这些因素影响蠕变的特性,因此决定了电子封装的焊点可靠性。在这项研究中,建立了晶体粘塑性模型来捕获单晶,双晶和多晶情况下SnAgCu焊点的各向异性行为。为了模拟热循环下焊点的响应,执行了多尺度有限元建模。在全局模型中,模拟了倒装芯片封装中的接头响应。然后在单关节的子模型中采用位移结果。将获得的结果与基于传统各向同性本构描述的结果进行比较。 (c)2006 Elsevier B.V.保留所有权利。

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