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Preparation of thin-film thermistor for the temperature sensor with wide temperature range and rapid responsiveness

机译:具有宽温度范围和快速响应性的温度传感器薄膜热敏电阻的制备

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摘要

A thin-film thermistor using (Al,Cr,Fe){sub}2O{sub}3 film with corundum structure was prepared, and characteristics of resistance-temperature and responsiveness were investigated. The corundum-type (Al,Cr,Fe){sub}2O{sub}3 film was obtained by plasma enhanced metal organic chemical vapor deposition (MOCVD)and heat treatment in air. In this process, the deposition rate of the film was as high as 40 nm/min and the crystallization temperature for corundum structure was as low as 1200℃. The characteristics of resistance-temperature and responsiveness indicated that the thin-film thermistor allows temperature detection over wide range from 200℃ to 950℃ and rapid responsiveness of 3 times as fast as that of a conventional bulk thermistor.
机译:制备了具有刚玉结构的(Al,Cr,Fe){sub} 2O {sub} 3薄膜的薄膜热敏电阻,并研究了其电阻温度和响应特性。通过等离子体增强金属有机化学气相沉积(MOCVD)和空气中热处理获得了刚玉型(Al,Cr,Fe){sub} 2O {sub} 3薄膜。在此过程中,薄膜的沉积速率高达40 nm / min,刚玉结构的结晶温度低至1200℃。电阻-温度和响应特性的特点表明,薄膜热敏电阻可以在200℃至950℃的宽范围内进行温度检测,其快速响应速度是常规体热敏电阻的3倍。

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