Test generation for acyclic sequential circuits using combinational ATPG for single stuck-at faults

摘要

Test generation for acyclic sequential circuits using time-expansion model requires combinational test pattern generation algorithm which can deal with multiple stuck-at faults, even if the target faults are single stuck-at faults. In this paper, we propose a test generation procedure for acyclic sequential circuits with a circuit model which can express multiple stuck-at faults in time-expansion model as single stuck-at faults. Our procedure can generate test sequences for acyclic sequential circuits with just combinational test pattern generation algorithm for single stuck-at faults. Experimental results show that test sequences with high fault efficiency are generated in small computational time.