首页> 外文期刊>Journal of the Korean Physical Society >Polarization Switching Behaviors in Multiferroic BiFeO_3(001) Thin FilmCapacitors under In-plane Magnetic Field
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Polarization Switching Behaviors in Multiferroic BiFeO_3(001) Thin FilmCapacitors under In-plane Magnetic Field

机译:平面磁场下多铁性BiFeO_3(001)薄膜电容器的极化转换行为

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摘要

We investigated the polarization switching behaviors of epitaxial BiFeO_3(001) films under mag-netic fields. The polarization switching behaviors in the BiFeO_3(001) films were well described byusing the Kolmogorov-Avrami-lshibashi model and by assuming Lorentzian distribution functionsof the logarithm of the characteristic switching time. These results were attributed to domain wallpinning effects, probably due to interaction between domain walls and defects or antiferromagneticdomains in the films. Finally, from the magnetic-field dependence of the polarization switchingbehaviors, we found that the ferroelectric and the antiferromagnetic domains in the BiFeO_3(001)films were weakly coupled, leading to a shift in the polarization switching behaviors.
机译:我们研究了在磁场下外延BiFeO_3(001)薄膜的偏振转换行为。通过使用Kolmogorov-Avrami-lshibashi模型并假设特征切换时间的对数为Lorentzian分布函数,可以很好地描述BiFeO_3(001)薄膜中的偏振切换行为。这些结果归因于畴壁钉扎效应,这可能是由于畴壁与薄膜中缺陷或反铁磁畴之间的相互作用所致。最后,从极化转换行为的磁场依赖性,我们发现BiFeO_3(001)薄膜中的铁电和反铁磁畴弱耦合,从而导致极化转换行为的转变。

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