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Photoconductive UV Detectors Based on ZnO Films Prepared by Sol-Gel Method

机译:Sol-Gel法制备的ZnO薄膜光电导紫外探测器

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摘要

Highly c-axis oriented ZnO thin films were deposited on single crystal Si(111)substrates by sol-gel method.The photoconductive UV detectors based on ZnO thin films,being a metal-semiconductor-metal(MSM)structure with interdigital(IDT)configuration,were fabricated by using Au as contact metal.The characteristics of dark and photocurrent of the UV detector,the UV photoresponse of the detector were investigated.The linear current-voltage(I-V)characteristics under both forward and reverse bias exhibit ohmic metal-semiconductor contacts.Under illumination using monochromatic light with a wavelength of 365 nm,photo-generated current arrived at 44.89 muA at a bias of 6 V.The detector exhibits an evident wide-range spectral responsivity and shows a trend similar to that in photoluminescence(PL)spectrum.PL spectrum of detector exhibits two peaks,one is the near band edge emission,and another is the deep-level emission in the visible region.
机译:采用溶胶-凝胶法在单晶Si(111)衬底上沉积高c轴取向的ZnO薄膜。基于ZnO薄膜的光电导紫外检测器为叉指(IDT)金属-半导体-金属(MSM)结构构造,以金为接触金属制造。研究了紫外探测器的暗态和光电流特性,研究了探测器的紫外光响应。正向和反向偏压下的线性电流-电压(IV)特性均表现为欧姆金属-半导体触点。在波长为365 nm的单色光照射下,光生电流在6 V偏压下达到44.89μA。该检测器表现出明显的宽光谱响应度,并显示出与光致发光相似的趋势(检测器的PL光谱有两个峰,一个是近带边缘发射,另一个是可见光区的深能级发射。

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