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Effect of a stochastic electron background on low-m tearing modes

机译:随机电子本底对低m撕裂模式的影响

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摘要

The effect of a stochastic electron background on the stability of low-m tearing modes is studied. The coherent direct interaction approximation is applied to the drift-kinetic equation in order to include the effects of current density diffusion, electron density diffusion and magnetic field diffusion in the tearing mode equations. It is found that for the m=1 mode in the collisionless regime the magnetic field diffusion destabilizes the mode further, while in the collisional regime these diffusions may not significantly affect the mode; for the m[gt-or-equal, slanted]2 modes in the collisional and semicollisional regimes the electron density diffusion stabilizes the modes, while in the collisionless regime the effects of current density diffusion and electron density diffusion may balance each other without significantly affecting the modes.
机译:研究了随机电子背景对低m撕裂模式稳定性的影响。为了将电流密度扩散,电子密度扩散和磁场扩散的影响包括在撕裂模式方程中,将相干直接相互作用近似应用于漂移动力学方程。发现对于无碰撞状态下的m = 1模式,磁场扩散进一步使模式不稳定,而在碰撞状态下这些扩散可能不会显着影响模式;相反,在无碰撞状态下,磁场扩散可能不会显着影响模式。对于在碰撞和半碰撞状态下的m [gt或等于,倾斜的] 2模式,电子密度扩散使模式稳定,而在无碰撞状态下,电流密度扩散和电子密度扩散的影响可以彼此平衡,而不会显着影响模式。

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