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Gas phase chemical vapor deposition chemistry of triethylboron probed by boron-carbon thin film deposition and quantum chemical calculations

机译:硼碳薄膜沉积探测三乙基硼的气相化学气相沉积化学及量子化学计算

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摘要

We present triethylboron (TEB) as a single-source precursor for chemical vapor deposition (CVD) of BxC thin films and study its gas phase chemistry under CVD conditions by quantum chemical calculations. A comprehensive thermochemical catalogue for the species of the gas phase chemistry of TEB is examined and found to be dominated by beta-hydride eliminations of C2H4 to yield BH3. A complementary bimolecular reaction path based on H-2 assisted C2H6 elimination to BH3 is also significant at lower temperatures in the presence of hydrogen. Furthermore, we find a temperature window of 600-1000 degrees C for the deposition of X-ray amorphous BxC films with 2.5 <= x <= 4.5 from TEB. Films grown at temperatures below 600 degrees C contain high amounts of H, while temperatures above 1000 degrees C result in C-rich films. The film density and hardness are determined to be in the range of 2.40-2.65 g cm(-3) and 29-39 GPa, respectively, within the determined temperature window.
机译:我们提出三乙基硼(TEB)作为BxC薄膜化学气相沉积(CVD)的单源前驱体,并通过量子化学计算研究其在CVD条件下的气相化学性质。检查了关于TEB气相化学种类的综合热化学目录,发现该化学目录主要受C2H4的β-氢化物消除而产生BH3。在氢气存在下,在较低温度下,基于H-2辅助C2H6消除为BH3的互补双分子反应路径也很重要。此外,我们发现600-1000摄氏度的温度窗口用于从TEB沉积2.5 <= x <= 4.5的X射线非晶BxC膜。在低于600摄氏度的温度下生长的薄膜含有大量的H,而高于1000摄氏度的温度会生成富含C的薄膜。在确定的温度窗口内,膜密度和硬度分别确定为2.40-2.65 g cm(-3)和29-39 GPa。

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