Study on atomic density changes in the liquid Al-Si alloys by X-ray diffraction method

Wang WM.; Qin JY.; Fan TG.; Bian XF.

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Study on atomic density changes in the liquid Al-Si alloys by X-ray diffraction method

机译：X射线衍射法研究液态铝硅合金中原子密度的变化

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来源
《Journal of Materials Science Letters》 |2000年第17期|共3页
作者
Wang WM.; Qin JY.; Fan TG.; Bian XF.;
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正文语种 eng
中图分类工程材料学;
关键词
Sicp/al composite;

机译：Sicp / Al复合材料;

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专利

1. Study on atomic density changes in the liquid Al-Si alloys by X-ray diffraction method [J] . Wang WM., Qin JY., Fan TG., Journal of Materials Science Letters . 2000,第17期

机译：X射线衍射法研究液态铝硅合金中原子密度的变化
2. Partial pair correlation functions and viscosity of liquid Al-Si hypoeutectic alloys via high-energy X-ray diffraction experiments [J] . Srirangam P., Jeyakumar M., Kramer M.J., Philosophical magazine: structure and properties of condensed matter . 2011,第28a30期

机译：高能X射线衍射实验研究液态Al-Si亚共晶合金的部分对相关函数和粘度
3. X-ray nano-diffraction study of Sr intermetallic phase during solidification of Al-Si hypoeutectic alloy [J] . Applied Physics Letters . 2014,第7期

机译：Al-Si亚共晶合金凝固过程中Sr金属间相的X射线纳米衍射研究
4. Study on Liquid Structure of Al-Si Alloy by X-ray Diffraction Analysis [C] . WANG Weimin, BIAN Xiufang, QINJinyu Asian Foundry Congress; 19970923-19970925; Nanjing; CN . 1997

机译：X射线衍射分析研究Al-Si合金的液相结构
5. Structural and electron density changes in dense guest-host systems: Analysis of X-ray diffraction data by the Rietveld and Maximum Entropy Methods. [D] . Flacau, Roxana Ioana. 2007

机译：致密客体系统中的结构和电子密度变化：通过Rietveld和最大熵方法分析X射线衍射数据。
6. Hydrogen Atomic Positions of O–H···O Hydrogen Bonds in Solution and in the Solid State: The Synergy of Quantum Chemical Calculations with 1H-NMR Chemical Shifts and X-ray Diffraction Methods [O] . Michael G. Siskos, M. Iqbal Choudhary, Ioannis P. Gerothanassis 2017

机译：溶液和固态中O–H···O氢键的氢原子位置：量子化学计算与1H-NMR化学位移和X射线衍射方法的协同作用
7. Studies of Mn/GaAs digital alloys using x-ray absorption fine structure and x-ray diffraction methods [O] . Y. L. Soo 2011

机译：利用X射线吸收精细结构和X射线衍射方法研究Mn / GaAs数字合金
8. SUBSTRUCTURE CHARACTERISTICS OF FINE-GRAINED AND ALLOYS DISCLOSED BY X-RAY MICROSCOPY AND DIFFRACTION ANALYSIS Description and Application of Diffraction Method Description of X-Ray Double-Crystal Diffractometer Combining X-ray Microscopy and Diffraction [R] . Sigmund Weissmann, K. A. Turner 1958

机译：X射线显微镜衍射分析细晶粒和合金的子结构特征及衍射分析描述X射线双晶衍射仪结合X射线显微镜和衍射的描述和应用

Study on atomic density changes in the liquid Al-Si alloys by X-ray diffraction method

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