Automatic Handling of Programmable On-Product Clock Generation (OPCG) Circuitry for Low Power Aware Delay Test

摘要

This paper describes how we provide a mean for dealing with the programmable aspects of on-product clock generation (OPCG) for use during ATPG and how that can also help with low power delay test. The system described in this paper automatically generates mode initialization sequence, setup sequence, test sequence and others and enables low power aware delay test when faster on product clocks are present on board. This system has successfully been used to process delay test for ASIC chips even with 22 PLLs on board.