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首页> 外文期刊>Diffusion and Defect Data. Solid State Data, Part B. Solid State Phenomena >Terahertz Emission from Phosphor Centers in SiGe and SiGe/Si Semiconductors
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Terahertz Emission from Phosphor Centers in SiGe and SiGe/Si Semiconductors

机译:SiGe和SiGe / Si半导体中的磷光体中心的太赫兹发射

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Terahertz-range photoluminescence from silicon-germanium crystals and superlattices doped by phosphor has been studied under optical excitation by radiation from a mid-infrared CO2 laser at low temperature. SiGe crystals with a Ge content between 0,9 and 6 5%, doped by phosphor with a concentration optimal for silicon laser operation, do not exhibit terahertz gain. On the contrary, terahertz-range gain of -2,3 -3,2 cm"1 has been observed fbi donor-related optical transitions in Si/SiGe strained superlattices at pump intensities above 100 kW/cm2.
机译:硅锗晶体和磷掺杂的超晶格在太赫兹范围的光致发光已在低温下由中红外CO2激光器的辐射在光激发下进行了研究。 Ge含量在0.9%到6%的5%之间的SiGe晶体掺有磷光粉,其浓度最适合用于硅激光操作,没有显示太赫兹增益。相反,在泵浦强度高于100 kW / cm2的情况下,在Si / SiGe应变超晶格中观察到了fbi供体相关的光学跃迁,其太赫兹范围增益为-2,3 -3,2 cm“ 1。

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