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首页> 外文期刊>Journal of Electronic Materials >Synthesis of Ge_(1-x)Sn_(x) Alloy Thin Films Using Ion Implantation and Pulsed Laser Melting (II-PLM)
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Synthesis of Ge_(1-x)Sn_(x) Alloy Thin Films Using Ion Implantation and Pulsed Laser Melting (II-PLM)

机译:离子注入和脉冲激光熔化(II-PLM)合成Ge_(1-x)Sn_(x)合金薄膜

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摘要

Ge_(1-x)Sn_(x) thin films are interesting for all-group-IV optoelectronics because of a crossover to a direct bandgap with dilute Sn alloying. However, Sn has vanishing room-temperature equilibrium solubility in Ge, making their synthesis very challenging. Herein, we report on our attempts to synthesize Ge_(1-x)Sn_(x) films on Ge (001) using ion implantation and pulsed laser melting (II-PLM). A maximum of 2 at.percent Sn was incorporated with our experimental conditions in the samples as determined by Rutherford back scattering spectroscopy. A red-shift in the Ge optical phonon branch and increased absorption below the Ge bandgap with increasing Sn concentration indicate Sn-induced lattice- and band-structure changes after II-PLM. However, ion-channeling and electron microscopy show that the films are not of sufficient epitaxial quality for use in devices.
机译:Ge_(1-x)Sn_(x)薄膜对于全IV组光电子来说很有趣,这是因为通过稀Sn合金可以跨越直接带隙。但是,Sn在Ge中的室温平衡溶解度逐渐消失,使其合成非常具有挑战性。在此,我们报告了我们使用离子注入和脉冲激光熔化(II-PLM)在Ge(001)上合成Ge_(1-x)Sn_(x)膜的尝试。通过Rutherford背散射光谱法测定的样品中,我们的实验条件最多掺入2 at。%Sn。 Ge光学声子分支中的红移和随着Sn浓度的增加在Ge带隙以下的吸收增加表明II-PLM后Sn诱导的晶格和能带结构发生了变化。然而,离子通道和电子显微镜显示该膜没有足够的外延质量用于设备中。

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