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Constitutive Relations on Creep for SnAgCuRE Lead-Free Solder Joints

机译:SnAgCuRE无铅焊点蠕变的本构关系

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Taking the most promising substitute of the Sn-3.8Ag-0.7Cu solder as the research base,investigations were made to explore the effect of rare earths(REs)on the creep performance of the Sn-3.8Ag-0.7Cu solder joints.The SnAgCu-O.IRE solder with the longest creep-rupture life was selected for subsequent research.Creep strain tests were conducted on Sn-3.8Ag-0.7Cu and SnAgCu-O.IRE solder joints in the intermediate temperature range from 298 K to 398 K,corresponding to the homologous temperatures eta=0.606,0.687,0.748,and 0.809 and eta=0.602,0.683,0.743,and 0.804,respectively,to acquire the relevant creep parameters,such as stress exponent and activation energy,which characterize the creep mechanisms.The final creep constitutive equations for Sn-3.8Ag-0.7Cu and SnAgCu-O.IRE solder joints were established,demonstrating the dependence of steady-state creep rate on stress and temperature.By correcting the apparent creep-activation energy of Sn-3.8Ag-0.7Cu and SnAgCu-O.IRE solder joints from the experiments,the true creep-activation energy is obtained.Results indicated that at low stress,the true creep-activation energy of Sn-3.8Ag-0.7Cu and SnAgCu-O.IRE solder joints is close to the lattice self-diffusion activation energy,so the steady-state creep rates of these two solder joints are both dominated by the rate of lattice self-diffusion.While at high stress,the true creep-activation energy of Sn-3.8Ag-0.7Cu and SnAgCu-O.IRE solder joints is close to the dislocation-pipe diffusion activation energy,so the steady-state creep rates are dominated by the rate of dislocation-pipe diffusion.At low stress,the best-fit stress exponents n of Sn-3.8Ag-0.7Cu and SnAgCu-O.IRE solder joints are 6.9 and 8.2,respectively,and the true creep-activation energy of them both is close to that of lattice self-diffusion.At high stress,it equals 11.6 and 14.6 for Sn-3.8Ag-0.7Cu and SnAgCu-O.IRE solder joints,respectively,and the true creep-activation energy for both is close to that of the dislocation-pipe diffusion.Thus,under the condition of the experimental temperatures and stresses,the dislocation climbing mechanism serves as the controlling mechanism for creep deformation of Sn-3.8Ag-0.7Cu and SnAgCu-O.IRE solder joints.The creep values of Sn-3.8Ag-0.7Cu and SnAgCu-O.IRE solder joints are both controlled by dislocation climbing.Dislocation glide and climb both contribute to creep deformation,but the controlling mechanism is dislocation climb.At low stress,dislocation climbing is dominated by the lattice self-diffusion process in the Sn matrix and dominated by the dislocation-pipe diffusion process at high stress.
机译:以最有希望的Sn-3.8Ag-0.7Cu焊料替代品为研究基础,进行了研究,探讨了稀土(Res)对Sn-3.8Ag-0.7Cu焊料接头蠕变性能的影响。选择了蠕变断裂寿命最长的SnAgCu-O.IRE焊料进行后续研究。在298 K至398的中间温度范围内对Sn-3.8Ag-0.7Cu和SnAgCu-O.IRE焊点进行了蠕变测试K分别对应于同源温度eta = 0.606、0.687、0.748和0.809和eta = 0.602、0.683、0.743和0.804,以获得表征蠕变的相关蠕变参数,如应力指数和活化能建立了Sn-3.8Ag-0.7Cu和SnAgCu-O.IRE焊点的最终蠕变本构方程,论证了稳态蠕变速率对应力和温度的依赖性。通过校正Sn的表观蠕变活化能-3.8Ag-0.7Cu和SnAgCu-O.IRE焊点结果表明,在低应力下,Sn-3.8Ag-0.7Cu和SnAgCu-O.IRE焊点的真实蠕变激活能接近晶格自扩散激活。能量,所以这两个焊点的稳态蠕变速率都受晶格自扩散速率的支配。在高应力下,Sn-3.8Ag-0.7Cu和SnAgCu-O的真实蠕变激活能。 IRE焊点接近位错管扩散活化能,因此稳态蠕变速率受位错管扩散速率的控制。在低应力下,Sn-3.8Ag-0.7的最佳拟合应力指数n Cu和SnAgCu-O.IRE焊点分别为6.9和8.2,它们的真实蠕变激活能都接近晶格自扩散能。在高应力下,Sn-3.8Ag的等效蠕变能为11.6和14.6分别为-0.7Cu和SnAgCu-O.IRE焊点,并且两者的真实蠕变激活能都接近位移因此,在实验温度和应力的条件下,位错爬升机制是控制Sn-3.8Ag-0.7Cu和SnAgCu-O.IRE焊点蠕变变形的控制机制。 Sn-3.8Ag-0.7Cu和SnAgCu-O.IRE焊点均受位错爬升控制。位错滑移和爬升均会引起蠕变变形,但控制机制是位错爬升。在低应力下,位错爬升主要由位错爬升控制。 Sn基体中的晶格自扩散过程,在高应力下以位错管扩散过程为主。

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