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首页> 外文期刊>Journal of Applied Crystallography >Growth of a three-dimensional anisotropic lattice of Ge quantum dots in an amorphous alumina matrix
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Growth of a three-dimensional anisotropic lattice of Ge quantum dots in an amorphous alumina matrix

机译:非晶态氧化铝基体中Ge量子点三维各向异性晶格的生长

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摘要

Simple processes for the preparation of semiconductor quantum dot lattices embedded in dielectric amorphous matrices play an important role in various nanotechnology applications. Of particular interest are quantum dot lattices with properties that differ significantly in different directions parallel to the material surface. Here, a simple method is demonstrated for the fabrication of an anisotropic lattice of Ge quantum dots in an amorphous Al2O3 matrix by a self-assembly process. A specific deposition geometry with an oblique incidence of the Ge and Al2O3 adparticles was used during magnetron sputtering deposition to achieve the desired anisotropy. The observed Ge quantum dot ordering is explained by a combination of directional diffusion of adparticles from the Ge and Al2O3 targets and a shadowing process which occurs during deposition as a result of the specific surface morphology. The prepared material shows a strong anisotropy of the electrical conductivity in different directions parallel to the sample surface.
机译:制备嵌入在介电非晶态基质中的半导体量子点晶格的简单方法在各种纳米技术应用中起着重要作用。特别感兴趣的是量子点晶格,其性质在平行于材料表面的不同方向上显着不同。在这里,演示了一种简单的方法,通过自组装工艺在非晶Al2O3基质中制造Ge量子点的各向异性晶格。在磁控溅射沉积过程中,使用具有Ge和Al2O3吸附颗粒倾斜入射的特定沉积几何形状,以实现所需的各向异性。观察到的Ge量子点有序性是通过结合来自Ge和Al2O3靶的粒子的方向性扩散以及由于特定表面形态而在沉积过程中发生的阴影过程的结合来解释的。所制备的材料在平行于样品表面的不同方向上显示出很强的各向异性。

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