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Production of three-dimensional quantum dot lattice of Ge/Si core–shell quantum dots and Si/Ge layers in an alumina glass matrix

机译:氧化铝玻璃基体中Ge / Si核-壳量子点和Si / Ge层的三维量子点晶格的产生

摘要

We report on the formation of Ge/Si quantum dots with core/shell structure that are arranged in a three-dimensional body centered tetragonal quantum dot lattice in an amorphous alumina matrix. The material is prepared by magnetron sputtering deposition of Al2O3/Ge/Si multilayer. The inversion of Ge and Si in the deposition sequence results in the formation of thin Si/Ge layers instead of the dots. Both materials show an atomically sharp interface between the Ge and Si parts of the dots and layers. They have an amorphous internal structure that can be crystallized by an annealing treatment. The light absorption properties of these complex materials are significantly different compared to films that form quantum dot lattices of the pure Ge, Si or a solid solution of GeSi. They show a strong narrow absorption peak that characterizes a type II confinement in accordance with theoretical predictions. The prepared materials are promising for application in quantum dot solar cells.
机译:我们报告了具有核/壳结构的Ge / Si量子点的形成,这些量子点排列在非晶态氧化铝基质中的三维体心四方量子点晶格中。该材料是通过磁控溅射沉积Al2O3 / Ge / Si多层膜制备的。 Ge和Si在沉积顺序中的反转导致形成薄的Si / Ge层而不是点。两种材料都在点和层的Ge和Si部分之间显示出原子上清晰的界面。它们具有可以通过退火处理结晶的无定形内部结构。与形成纯Ge,Si或GeSi固溶体的量子点晶格的薄膜相比,这些复合材料的光吸收特性显着不同。它们显示出很强的窄吸收峰,该峰根据理论预测表征了II型限制。制备的材料有望用于量子点太阳能电池。

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