首页> 外文期刊>Journal of Applied Crystallography >Kikuchi bandlet method for the accurate deconvolution and localization of Kikuchi bands in Kikuchi diffraction patterns
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Kikuchi bandlet method for the accurate deconvolution and localization of Kikuchi bands in Kikuchi diffraction patterns

机译:菊池能带法用于菊池衍射图中菊池带的精确去卷积和定位

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摘要

In order to retrieve crystallographic information from an electron backscatter Kikuchi diffraction pattern, its Kikuchi bands have to be localized. One of the main reasons for the limited precision of the present Kikuchi band localization methods is that the diffuse edges of a Kikuchi band are convoluted by many other Kikuchi bands that intersect them. To improve the localization accuracy, Kikuchi bands have to be deconvoluted. In this article, a new method for the deconvolution and localization of Kikuchi bands is presented. The deconvolution is based on the fact that, in a Kikuchi pattern, there are a number of Kikuchi bands that are not parallel to the bands that intersect them. It is performed in Fourier space. After deconvolution, localization is carried out by a quantitative shape analysis of the intensity profiles of the deconvoluted Kikuchi bands. Using the introduced method, for a real electron backscatter Kikuchi diffraction pattern with 45° half capture angle and 0.12° per pixel maximum scale factor, the characteristic hyperbolic features of the Kikuchi bands can be localized with a precision of better than 0.1° in reflection angle.
机译:为了从电子反向散射菊池衍射图案中检索晶体学信息,必须对其菊池带进行定位。当前菊池带定位方法的精度有限的主要原因之一是,菊池带的扩散边缘被与其交叉的许多其他菊池带卷积。为了提高定位精度,必须对菊池带进行反卷积。在本文中,提出了一种菊池带反卷积和定位的新方法。反卷积基于以下事实:在菊池模式中,有许多菊池带并不平行于与它们相交的带。它在傅立叶空间中执行。去卷积后,通过对去卷积的菊池带的强度分布图进行定量形状分析来进行定位。使用引入的方法,对于具有45°半捕获角和每像素最大比例因子0.12°的真实电子背散射菊池衍射图,可以以反射角优于0.1°的精度定位菊池带的特征双曲线特征。 。

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