Dielectric relaxation phenomena in superparaelectric and ferroelectric ceramic thin films and the relevance with respect to high density DRAM and FRAM applications

摘要

Dielectric relaxation has been observed for a wide variety of materials. Especially for dielectric thin films a typical Curie - von Schweidler relaxation has been observed by many groups in the literature. although some possible reasons for these relaxation phenomena have been discussed, a comprehensive understanding of the physical origins involved could not be obtained by now. The purpose of this contribution is to present a wide range of experimental results collected on Pb(Zr, Ti)O_3 (PZT) thin films. Results are compared to investigations on (Ba, Sr)TiO_3 and SrTiO_3 films.