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Dynamical aspects of the surface layer build up on diamond and improvement of the conductivity stability

机译:表面层的动力学方面建立在金刚石上并改善了电导率稳定性

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In order to improve the reliability of the H surface layer properties and their long-term stability required for electronic device fabrication,in-situ measurements of the surface conductivity were performed after hydrogen plasma treatments to assess the parameters that are most affecting the conductivity.By using an optimised in-situ configuration,the influence of the gaseous environment after plasma treatment,as well as the temporal aspects of the rise of the surface conductivity were analysed.The importance of each step influencing the surface properties can be independently studied in order to check these effects,and namely the type and duration of several treatments,surface temperature,gaseous environments and electrical biasing of the contacts,the latter being responsible for attracting or repulsing ions from the diamond surface.Further,the dynamical aspects of the variation in conductivity and the time concerned to reach the surface conductivity with respect to the sample environments are also addressed.
机译:为了提高H表面层性能的可靠性及其电子设备制造所需的长期稳定性,在氢等离子体处理后对表面电导率进行了现场测量,以评估对电导率影响最大的参数。使用优化的原位配置,分析了等离子体处理后气体环境的影响以及表面电导率升高的时间方面。可以独立研究每个步骤对表面性能的重要性,以便检查这些影响,即几种处理的类型和持续时间,表面温度,气体环境和触点的电偏压,后者负责从金刚石表面吸引或排斥离子。此外,电导率变化的动力学方面以及相对于样品环境达到表面电导率所需的时间问题也得到解决。

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