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Surface carbon saturation as a means of CVD diamond nucleation enhancement

机译:表面碳饱和度作为CVD金刚石成核增强的一种手段

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摘要

During the initial stages of deposition, the growth of CVD diamond is accompanied by annihilation processes such as dissolution of diamond seeds into the substrate, and their etching by HF-activated hydrogen. As a result of such competingprocesses only sufficiently large diamond particles survive and contribute to the build-up of the diamond film. This situation prevails until i stable substrate surface is formed. To increase the nucleation density, the growth rate of diamond crystallites must be enhanced relative to their annihilation rate during the initial stages of deposition. In this work, using silicon substrates. we attempted to do so, by creating a large carbon supply on the substrate surface prior to diamond deposition. Carbon was accumulated by means of different pre-deposition steps: (1) exposure to a high CH{sub}4 concentration (10 vol%) under CVD conditions. (2) d.c.-glow discharge of a H{sub}2/CH{sub}4 gas mixture (9 vol% CH{sub}4), and (3) arc discharge of a carbon rod. Theeffect of titanium metal particles on the subsequent deposition was studied. To distinguish. in the deposited film, between carbon from the pre-deposited layer. and carbon from the gas phase, isotopic 13{sup left}CH{sub}4 was used during the CVD process.High-resolution electron microscopy (HRSEM). contact-mode atomic force microscopy (AFM), and micro-Raman spectroscopy were used to characterize the samples. The etching by the hot filament (HF) activated hydrogen was found to be the dominant cause forannihilation of growth centers on silicon substrates. 13{sup left}C labeling experiments have shown that excess surface carbon hinders diamond debris etching. rather than participates in subsequent growth. In contrast, metal additives such as Ti promotegrowth. conditioned by their direct exposure to the gas phase.
机译:在沉积的初始阶段,CVD金刚石的生长伴随着an灭过程,例如将金刚石种子溶解到基材中,以及通过HF活化的氢对其进行蚀刻。作为这种竞争过程的结果,仅足够大的金刚石颗粒得以生存并有助于金刚石膜的堆积。这种情况一直持续到形成稳定的衬底表面为止。为了增加成核密度,必须在沉积的初始阶段相对于其crystal灭率提高金刚石微晶的生长率。在这项工作中,使用硅衬底。我们尝试通过在沉积金刚石之前在基底表面上产生大量碳供应来实现这一目标。碳是通过不同的预沉积步骤积聚的:(1)在CVD条件下暴露于高CH {sub} 4浓度(10 vol%)。 (2)H {sub} 2 / CH {sub} 4混合气(9体积%CH {sub} 4)的直流辉光放电,和(3)碳棒的电弧放电。研究了钛金属颗粒对后续沉积的影响。区分。在沉积膜中,在来自预沉积层的碳之间。在气相沉积过程中使用了同位素13 {supleft} CH {sub} 4。气相电子显微镜(HRSEM)。接触模式原子力显微镜(AFM)和显微拉曼光谱用于表征样品。发现通过热丝(HF)活化的氢进行蚀刻是导致硅基板上生长中心消失的主要原因。 13 {C}标记实验表明,过量的表面碳会阻碍金刚石碎屑的蚀刻。而不是参与随后的增长。相反,金属添加剂如Ti促进生长。通过直接暴露于气相来调节。

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