首页> 外文期刊>Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology >Deposition, structure and hardness of Ti-Cu-N hard films prepared by pulse biased arc ion plating
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Deposition, structure and hardness of Ti-Cu-N hard films prepared by pulse biased arc ion plating

机译:脉冲偏压电弧离子镀Ti-Cu-N硬质薄膜的沉积,结构和硬度

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摘要

In this work, Ti-Cu-N hard nanocomposite films were deposited on 304 stainless steel (SS) substrate by using pulse biased arc ion plating system with Ti-Cu alloy target. The effects of negative substrate pulse bias voltages on chemical composition, structure, morphology and mechanical properties were investigated. The composition and structure of these films was found to be dependent on the pulse bias, whereas the pulse biases put little influence on hardness of these films. The XPS spectra of Cu 2p showed that obtained peak values correspond to pure metallic Cu. Cu content in Ti-Cu-N nanocomposite films changed with pulse bias voltage. In addition, X-ray diffraction analysis showed that a pronounced TiN (111) texture is observed under low pulse bias voltage while it changed to TiN (220) orientation under high pulse bias voltage. Surface roughness of the Ti-Cu-N nanocomposite films achieved to the minimum value of 0.11 μm with the negative pulse bias voltage of -600 V. The average grain size of TiN was less than 17 nm. The mechanical properties of Ti-Cu-N hard films investigated by nanoindentation revealed that the hardness was about 22-24 GPa and the hardness enhancement was not obtained.
机译:在这项工作中,通过使用带有Ti-Cu合金靶的脉冲偏置电弧离子镀系统,在304不锈钢(SS)基底上沉积了Ti-Cu-N硬纳米复合膜。研究了负衬底脉冲偏压对化学成分,结构,形态和力学性能的影响。发现这些膜的组成和结构取决于脉冲偏压,而脉冲偏压对这些膜的硬度影响很小。 Cu 2p的XPS光谱表明,所获得的峰值对应于纯金属Cu。 Ti-Cu-N纳米复合薄膜中的Cu含量随脉冲偏压的变化而变化。另外,X射线衍射分析表明在低脉冲偏压下观察到明显的TiN(111)织构,而在高脉冲偏压下变为TiN(220)取向。负脉冲偏置电压为-600 V时,Ti-Cu-N纳米复合膜的表面粗糙度达到最小值0.11μm。TiN的平均粒径小于17 nm。通过纳米压痕研究了Ti-Cu-N硬质薄膜的力学性能,发现其硬度约为22-24 GPa,未获得硬度的提高。

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