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Cochlear implant artifact attenuation in late auditory evoked potentials: A single channel approach

机译:耳蜗植入物在晚期听觉诱发电位中的衰减:单通道方法

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Recent evidence suggests that late auditory evoked potentials (LAEP) provide a useful objective metric of performance in cochlear implant (CI) subjects. However, the CI produces a large electrical artifact that contaminates LAEP recordings and confounds their interpretation. Independent component analysis (ICA) has been used in combination with multi-channel recordings to effectively remove the artifact. The applicability of the ICA approach is limited when only single channel data are needed or available, as is often the case in both clinical and research settings. Here we developed a single-channel, high sample rate (125kHz), and high bandwidth (0-100kHz) acquisition system to reduce the CI stimulation artifact. We identified two different artifacts in the recording: 1) a high frequency artifact reflecting the stimulation pulse rate, and 2) a direct current (DC, or pedestal) artifact that showed a non-linear time varying relationship to pulse amplitude. This relationship was well described by a bivariate polynomial. The high frequency artifact was completely attenuated by a 35Hz low-pass filter for all subjects (n=22). The DC artifact could be caused by an impedance mismatch. For 27% of subjects tested, no DC artifact was observed when electrode impedances were balanced to within 1kΩ. For the remaining 73% of subjects, the pulse amplitude was used to estimate and then attenuate the DC artifact. Where measurements of pulse amplitude were not available (as with standard low sample rate systems), the DC artifact could be estimated from the stimulus envelope. The present artifact removal approach allows accurate measurement of LAEPs from CI subjects from single channel recordings, increasing their feasibility and utility as an accessible objective measure of CI function.
机译:最近的证据表明,晚期听觉诱发电位(LAEP)为人工耳蜗(CI)受试者的表现提供了有用的客观指标。但是,CI会产生很大的电子伪影,从而污染LAEP录音并混淆其解释。独立成分分析(ICA)已与多通道记录结合使用,以有效去除伪影。当仅需要或可获得单个通道数据时,ICA方法的适用性受到限制,这在临床和研究环境中都是常见的情况。在这里,我们开发了单通道,高采样率(125kHz)和高带宽(0-100kHz)采集系统,以减少CI刺激伪影。我们在录音中发现了两种不同的伪影:1)反映刺激脉冲频率的高频伪影,以及2)直流(DC或基座)伪影显示出与脉冲幅度呈非线性时变关系。通过二元多项式可以很好地描述这种关系。高频伪像已通过35Hz低通滤波器完全衰减了所有对象(n = 22)。直流伪影可能是由阻抗不匹配引起的。对于27%的测试对象,当电极阻抗平衡在1kΩ以内时,没有观察到DC伪影。对于其余73%的受试者,使用脉冲幅度来估计然后减弱DC伪像。在无法测量脉冲幅度的情况下(与标准的低采样率系统一样),可以从刺激包络线估算出直流伪像。本发明的伪影去除方法允许从单通道记录精确测量来自CI受试者的LAEP,从而提高了其可行性和实用性,可作为CI功能的客观测量方法。

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