High-resolution microspectroscopy and sub-nanosecond time-resolved spectroscopy with the synchrotron infrared source

摘要

Infrared produced as synchrotron radiation has useful qualities for a number of infrared measurement methods. The most important is the high source brightness, which allows infrared microspectroscopy to be performed on sample regions having a size equal to the wavelength of light (a few microns). The source is also pulsed, enabling time-resolved spectroscopy to be performed without the need for a high-speed infrared detector. This paper reviews the qualities of infrared synchrotron radiation, and shows performance capabilities for microspectroscopy and sub-nanosecond time-resolved spectroscopy. Results from the National Syntchrotron Light Source infrared beamlines are presented or reviewed.