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首页> 外文期刊>Transactions of the Institute of Metal Finishing: The International Journal for Surface Engineering and Coatings >Influence of hydrogen on room temperature recrystallisation of electrodeposited Cu films: thermal desorption spectroscopy
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Influence of hydrogen on room temperature recrystallisation of electrodeposited Cu films: thermal desorption spectroscopy

机译:氢对电沉积铜膜室温再结晶的影响:热解吸光谱

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摘要

The mechanism of recrystallisation observed at room temperature in electrodeposited Cu films has been examined in light of the enhancement of metal atom diffusion by hydrogen induced superabundant vacancies. Thermal desorption spectroscopy revealed that Cu films electrodeposited from acid sulphate bath containing some specific additives showed a pronounced peak, which was ascribed to the break-up of vacancy-hydrogen clusters. The amount of desorbed hydrogen was comparable to that of vacancy type clusters estimated in previous positron annihilation experiments. The grain size of Cu films increased as hydrogen desorption proceeded. Such grain growths were not observed in the films deposited from the baths without additives. These results indicate that the room temperature recrystallisation of electrodeposited Cu films is caused by hydrogen induced superabundant vacancies.
机译:鉴于氢诱导的过剩空位促进了金属原子的扩散,已经研究了在室温下在电沉积铜膜中观察到的重结晶机理。热解吸光谱法表明,从含有某些特定添加剂的酸性硫酸浴中电沉积的铜膜显示出明显的峰,这归因于空位氢簇的分解。解吸的氢的量与先前的正电子an灭实验中估计的空位型团簇的量相当。随着氢解吸的进行,Cu膜的晶粒尺寸增加。在没有添加剂的情况下从浴中沉积的膜中未观察到这种晶粒长大。这些结果表明,电沉积铜膜的室温再结晶是由氢诱导的过量空位引起的。

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