A simple method for the determination of strains in epitaxial films: application to Eu(110) deposited on a Nb(110) buffer

摘要

YIn order to determine the strain tensor in a 375 nm thick Eu(110) epitaxial thin film, we have developed a new method, based on the accurate determination of the lattice vectors by high resolution X-ray diffraction. We show that a biaxial strain model gives a good representation of the state of the strains field in the film.