首页> 外文期刊>The European physical journal, B. Condensed matter physics >Hard axis magnetic field dependence on current-induced magnetization switching in MgO-based magnetic tunnel junctions
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Hard axis magnetic field dependence on current-induced magnetization switching in MgO-based magnetic tunnel junctions

机译:硬轴磁场对基于MgO的磁性隧道结中电流感应磁化切换的依赖性

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摘要

We conducted a detailed study of hard axis magnetic field (Hhard) dependence on currentinduced magnetization switching (CIMS) in MgO-based magnetic tunnel junctions (MTJs) with various junction sizes and various uniaxial anisotropy fields. The decreases in critical current density (Jc) and the intrinsic critical current density (Jc0) estimated from the pulse duration dependence on Jc in CIMS are observed when applying Hhard for all MTJs. The decrease in energy barrier of CIMS is also observed except for the largest sample. These results indicate that the reduction of Jc is attributable to both the increase of spin-transfer efficiency and the decrease in energy barrier in the case of applying Hhard. The Jc0 decreases with increase in the mutual angle between the direction of magnetization and the easy axis (θf ), which is consistent with the theoretical prediction proposed by Slonczewski. The degree of the reduction of Jc0 for the same value of Hhard decreases with decreasing size of MTJs. This behavior is considered to be related to not only decrease in θf due to the increase in anisotropy field in MTJs, but also to the increase in the variance of the initial angle of magnetization due to the thermally activated magnon excitation. The stable switching endurance related to CIMS was observed in a wide range of MTJ sizes when applying Hhard. Moreover, we proposed a new architecture and a new switching method considering write disturbance. These results would be useful for application to spin memory and other spin-electronic devices.
机译:我们对具有各种结尺寸和各种单轴各向异性场的基于MgO的磁隧道结(MTJ)中的硬轴磁场(Hhard)依赖于电流感应磁化开关(CIMS)进行了详细研究。当对所有MTJ应用Hhard时,会观察到临界电流密度(Jc)和固有临界电流密度(Jc0)的降低,这是根据CIMS中脉冲持续时间对Jc的依赖性而得出的。除了最大的样本外,还观察到CIMS的能垒降低。这些结果表明,在使用Hhard的情况下,Jc的降低归因于自旋转移效率的提高和能垒的降低。 Jc0随磁化方向和易轴(θf)之间的夹角增加而减小,这与Slonczewski提出的理论预测是一致的。对于相同的Hhard值,Jc0的减少程度随着MTJ尺寸的减小而减小。该行为被认为不仅与由于MTJ中的各向异性场的增加而引起的θf的减小有关,而且与由于热激活的磁振子激发引起的初始磁化角的方差的增加有关。使用Hhard时,在各种MTJ尺寸中都观察到了与CIMS相关的稳定开关耐久性。此外,我们提出了一种考虑写干扰的新架构和新切换方法。这些结果对于应用于自旋存储器和其他自旋电子设备将是有用的。

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