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Photoreflectance investigation of hydrogenated (InGa)(AsN)/GaAs heterostructures

机译:氢化(InGa)(AsN)/ GaAs异质结构的光反射研究

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The optical response of as grown and hydrogenated In_(0.32)Ga_(0.68)As_(1-y)N_y/GaAs single quantum wells (y = 0, 0.027) has been investigated from T = 80 K to room temperature by photoreflectance. Three excitonic spectral features detected in the N free sample shift to lower energy in the N containing sample and back to higher energy upon H irradiation of the N containing sample. In the hydrogenated sample, a progressive change with increasing temperature of the nature of the lowest energy transition from an excitonic to a band-to-band character has been explained in terms of an increasing release of carriers from traps formed by H and N clusters. A reduction in the oscillator strength of the lowest energy transition and an increase in the binding energy of the heavy-hole exciton have been explained in terms of an increase in the electron effective mass upon N introduction into the In_xGa_(1-x)As lattice.
机译:通过光反射研究了从T = 80 K到室温,生长和氢化的In_(0.32)Ga_(0.68)As_(1-y)N_y / GaAs单量子阱(y = 0,0.027)的光学响应。在不含N的样品中检测到的三个激子光谱特征转移到含N的样品中较低的能量,并在含N的样品进行H辐照后返回较高的能量。在氢化样品中,已经解释了从激子到带间特性的最低能级跃迁的性质随着温度的升高而逐渐变化,这是由于载流子从H和N团簇形成的陷阱中释放的增加所致。已经通过在将N引入In_xGa_(1-x)As晶格中电子有效质量的增加来解释了最低能量跃迁的振荡器强度的降低以及重空穴激子的结合能的增加。 。

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