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Monte Carlo Simulation of Spin Polarized Transport in Nanowires and 2-D Channels of III-V Semiconductors

机译:III-V半导体的纳米线和二维通道中自旋极化传输的蒙特卡洛模拟

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摘要

We simulated spin polarized transport of electrons along III-V nanowires and two dimensional III-V channels using semi classical Monte Carlo method. Properties of spin relaxation length have been investigated in different III-V zinc-blende materials at various conditions, such as, temperature, external field etc. Spin dephasing in III-V channels is caused due to D'yakonov-Perel (DP) relaxation and due to Elliott-Yafet (EY) relaxation. Spin dephasing length in nanowire is found to be greater than that in 2-D channel.
机译:我们使用半经典蒙特卡洛方法模拟了电子沿III-V纳米线和二维III-V通道的自旋极化传输。已经在不同的条件下(例如温度,外部场等)在不同的III-V闪锌矿材料中研究了自旋弛豫长度的特性。III-V通道中的自旋移相是由于D'yakonov-Perel(DP)弛豫引起的并且由于Elliott-Yafet(EY)的放松。发现纳米线中的自旋移相长度大于2-D通道中的自旋相移长度。

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