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Employing microsecond pulses to form laser-fired contacts in photovoltaic devices

机译:利用微秒脉冲在光伏设备中形成激光触发触点

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摘要

Laser-fired contacts (LFCs) are typically fabricated with nanosecond pulse durations despite the fact that extremely precise and costly control of the process is necessary to prevent significant ablation of the aluminum metallization layer. Microsecond pulse durations offer the advantage of reduced metal expulsion and can be implemented with diffractive optics to process multiple contacts simultaneously and meet production demands. In this work, the influence of changes in laser processing parameters on contact morphology, resistance, and composition when using microsecond pulses has been fully evaluated. Simulated and experimental results indicate that contacts are hemispherical or half-ellipsoidal in shape. In addition, the resolidified contact region is composed of a two-phase aluminum-silicon microstructure that grows from the single-crystal silicon wafer during resolidification. As a result, the total contact resistance is governed by the interfacial contact area for a three-dimensional contact geometry rather than the planar contact area at the aluminum-silicon interface in the passivation layer opening. The results also suggest that for two LFCs with the same size top surface diameter, the contact produced with a smaller beam size will have a 25-37% lower contact resistance, depending on the LFC diameter, because of a larger contact area at the LFC/wafer interface. Copyright (c) 2014 John Wiley & Sons, Ltd.
机译:尽管需要非常精确且昂贵的工艺控制来防止铝金属化层的明显烧蚀,但激光烧结触点(LFC)通常以纳秒脉冲持续时间制造。微秒脉冲持续时间提供了减少金属排出的优势,并且可以与衍射光学器件一起实施,以同时处理多个触点并满足生产需求。在这项工作中,已经充分评估了使用微秒脉冲时激光加工参数的变化对接触形态,电阻和组成的影响。模拟和实验结果表明,接触点的形状为半球形或半椭圆形。另外,再固化的接触区域由两相铝硅微结构组成,该两相铝硅微结构在再固化期间从单晶硅晶片生长。结果,总接触电阻由用于三维接触几何形状的界面接触区域而不是在钝化层开口中的铝-硅界面处的平面接触区域决定。结果还表明,对于两个具有相同顶表面直径尺寸的LFC,由于LFC的接触面积较大,因此根据LFC的直径,具有较小光束尺寸的触点的接触电阻将降低25-37%。 / wafer接口。版权所有(c)2014 John Wiley&Sons,Ltd.

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