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Deposition and boron doping of nano-crystalline diamond thin films on poly-crystalline diamond thick films

机译:多晶金刚石厚膜上纳米晶金刚石薄膜的沉积和硼掺杂

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摘要

Boron-doped nano-crystalline diamond (NCD) thin films have been successfully deposited on well-polished poly-crystalline diamond (PCD) thick films in a microwave plasma enhanced chemical vapor deposition (MPCVD) reactor for the first time. Different surface pretreatment techniques are carried out under different gas conditions (CH 4, H 2, Ar, and CH 4/H 2) to eliminate the effect of grain boundaries on the growth of a smooth NCD intrinsic layer. Well doped NCD films have been fabricated in CH 4/H 2/B 2H 6 plasma by varying the atomic ratio of B/C and the substrate temperature. Atomic force microscopy (AFM) results show that pretreatment in pure CH 4 plasma at 1000°C is most effective for NCD growth, while hydrogen containing plasma is harmful to the surface smoothness of NCD thin films. Doping research indicates that the optimum parameters for the boron-doping of high-quality NCD thin films are B/C=300 ppm (10 -6) and 800°C.
机译:首次在微波等离子体增强化学气相沉积(MPCVD)反应器中,将硼掺杂的纳米晶金刚石(NCD)薄膜成功沉积在抛光良好的多晶金刚石(PCD)厚膜上。在不同的气体条件下(CH 4,H 2,Ar和CH 4 / H 2)执行不同的表面预处理技术,以消除晶界对光滑NCD本征层生长的影响。通过改变B / C的原子比和衬底温度,已在CH 4 / H 2 / B 2H 6等离子体中制备了掺杂良好的NCD膜。原子力显微镜(AFM)结果表明,在纯CH 4等离子体中于1000°C进行预处理对于NCD生长最有效,而含氢等离子体则对NCD薄膜的表面光滑度有害。掺杂研究表明,高质量NCD薄膜硼掺杂的最佳参数为B / C = 300 ppm(10 -6)和800°C。

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