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首页> 外文期刊>Physical Review, B. Condensed Matter >ATOMIC AND ELECTRONIC STRUCTURES OF THE N SUBSTITUTIONAL IMPURITY IN SI
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ATOMIC AND ELECTRONIC STRUCTURES OF THE N SUBSTITUTIONAL IMPURITY IN SI

机译:Si中N取代杂质的原子和电子结构

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摘要

A first-principles calculation based on the local-density approximation and supercell model is performed for the N substitutional impurity in Si. Good agreement between theory and electron spin resonance (ESR) experiment is obtained: the stable atomic geometry is found to have the C-3v symmetry as indicated by ESR studies; the calculated energy difference between C-3v and T-d is less than 0.1 eV, while the experimental value is 0.073 eV; the calculated highest occupied level mainly consists of the Si dangling bond. The C-3v structures for P and As impurities are found to be unstable for the neutral and negative charge states. The reason for the difference between the N and other group-V atoms is discussed. [References: 22]
机译:对Si中的N取代杂质进行基于局部密度近似和超级单元模型的第一性原理计算。理论与电子自旋共振(ESR)实验之间取得了良好的一致性:ESR研究表明,稳定的原子几何具有C-3v对称性;计算得到的C-3v和T-d之间的能量差小于0.1 eV,而实验值为0.073 eV;计算出的最高占有水平主要由硅悬空键组成。发现P和As杂质的C-3v结构对于中性和负电荷状态不稳定。讨论了N和其他V族原子之间差异的原因。 [参考:22]

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