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首页> 外文期刊>Physical Review, B. Condensed Matter >SINGLE QUANTUM DOTS AS LOCAL PROBES OF ELECTRONIC PROPERTIES OF SEMICONDUCTORS
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SINGLE QUANTUM DOTS AS LOCAL PROBES OF ELECTRONIC PROPERTIES OF SEMICONDUCTORS

机译:单量子点作为半导体电子性能的局部问题

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We investigated size- and excitation-intensity-dependent changes of the luminescence spectra of single In0.14Ga0.86As/GaAs quantum dots with diameters between 200 and 40 nm. The dot sizes investigated range from effectively two-dimensional structures down to diameters which are comparable to the length scales of electronic excitations, e.g., the excitonic Bohr radius, or of compositional fluctuations at interfaces. For dots occupied by single excitons, the luminescence linewidth decreases continuously with decreasing diameter. Using model calculations we relate this behavior to compositional fluctuations and obtain an estimate for their characteristic length scale. If the dots are occupied by several excitons the luminescence linewidth increases systematically with decreasing size. We describe this behavior by a model of carrier-carrier interaction effects on the luminescence linewidths. [References: 14]
机译:我们研究了直径为200至40 nm的单个In0.14Ga0.86As / GaAs量子点的发光光谱的尺寸和激发强度相关变化。研究的点尺寸范围从有效的二维结构到直径,其可与电子激发的长度尺度(例如激子玻尔半径或界面处的成分波动)相当。对于单个激子占据的点,发光线宽随着直径的减小而连续减小。使用模型计算,我们将此行为与成分波动相关联,并获得其特征长度尺度的估计值。如果点被几个激子占据,则发光线宽随着尺寸的减小而系统地增加。我们通过对发光线宽的载流子-载流子相互作用影响模型来描述这种行为。 [参考:14]

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