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Level Crossing Rate and Average Fade Duration of Dual Selection Combining With Cochannel Interference and Nakagami Fading

机译:与同频道干扰和中神衰落相结合的双重选择的电平穿越速率和平均衰落持续时间

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摘要

This letter provides closed-form expressions for the outage probability, the average level crossing rate (LCR) and the average fade duration (AFD) of a dual diversity selection combining (SC) system exposed to the combined influence of the cochannel interference (CCI) and the thermal noise (AWGN) in Nakagami fading channel. The branch selection is based on the desired signal power SC algorithm with all input signals assumed to be independent, while the powers of the desired signals in all diversity branches are mutually equal but distinct from the power of the interference signals. The analytical results reduce to known solutions in the cases of an interference-limited system in Rayleigh fading and an AWGN-limited system in Nakagami fading. The average LCR is determined by an original approach that does not require explicit knowledge of the joint PDF of the envelope and its time derivative, which also paves the way for similar analysis of other diversity systems.
机译:这封信提供了双频分选组合(SC)系统的故障概率,平均电平穿越率(LCR)和平均衰落持续时间(AFD)的封闭形式表达,该系统受到同信道干扰(CCI)的综合影响中浪衰落信道中的热噪声(AWGN)。分支选择基于期望信号功率SC算法,其中所有输入信号均假定为独立,而所有分集分支中期望信号的功率相互相等,但与干扰信号的功率不同。在瑞利衰落中的干扰受限系统和中上衰落中的AWGN受限系统的情况下,分析结果简化为已知的解决方案。平均LCR由原始方法确定,该方法不需要明确了解信封的联合PDF及其时间导数,这也为其他分集系统的类似分析铺平了道路。

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