Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits

摘要

Sensitivity to process variations and manufacturing defects are major showstoppers for the high-volume manufacturing of carbon nanotube field-effect transistors (CNFETs). These imperfections affect gate delay and may remain undetected when test patterns obtained using conventional test-generation techniques are used. We propose a new test generation method that takes CNFET-specific process variations into account and identifies multiple testable long paths through each node in a netlist. In contrast to state-of-the-art techniques, our method can also handle variations that have a nonlinear impact on the propagation delay. The generated test patterns ensure the detection of delay faults through the longest path, even under random CNFET process variations. The proposed method shows significant improvement in the statistical delay quality level (SDQL) compared with a state-of-the-art technique and a commercial ATPG tool for multiple benchmarks. We observed a minimum of 17.1% improvement in the SDQL offered by our patterns over a test set of the same size generated by the commercial tool. We also show that our method, when integrated with the conventional transition fault test flow, offers a significant improvement in the quality of test patterns under random variations. Moreover, the proposed method is flexible and can be easily extended to other emerging device technologies.