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Systems and Methods for Testing and Diagnosing Delay Faults and For Parametric Testing in Digital Circuits
Systems and Methods for Testing and Diagnosing Delay Faults and For Parametric Testing in Digital Circuits
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机译:用于测试和诊断延迟故障以及数字电路中的参数测试的系统和方法
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摘要
Delay-fault testing and parametric analysis systems and methods utilizing one or more variable delay time-base generators. In embodiments of the delay-fault testing systems, short-delay logic paths are provided with additional scan-chain memory elements and logic that, in conjunction with the one or more variable-delay time-base generators, provides the effect of over-clocking without the need to over-clock. Related methods provide such effective over-clocking. In embodiments of parametric analysis systems, test point sampling elements and analysis circuitry are clocked as a function of the output of the one or more variable-delay time-base generators to provide various parametric analysis functionality. Related methods address this functionality.
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