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Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums

机译:使用连续校验和的线性模拟电路中的并发错误检测和容错

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The problem of concurrent error detection and fault tolerance is studied. These checksums of time-varying functions are possible because the function of a linear analog circuit can be represented mathematically by a set of matrices to which checksum codes can be applied. For the purpose of error detection, it is assumed that a fault can cause the value of a passive circuit component to deviate from its normal value, result in a line short or open, or change the operating characteristics of the active components (operational amplifiers). If the specifying parameters of a linear analog circuit change due to a fault and the failed circuit behaves as a linear system, then error correction is performed by compensating for the changed parameter values. Otherwise, partical correction is possible. Error detection and correction are performed by a small amount of hardware added to the linear analog circuit. The hardware overhead is virtually constant irrespective of the circuit size, and the sensitivity of the error detection circuit to failures can be easily calibrated.
机译:研究了并发错误检测和容错问题。这些时变函数的校验和是可能的,因为线性模拟电路的功能可以用一组可以应用校验和代码的矩阵来数学表示。出于错误检测的目的,假定故障可能导致无源电路组件的值偏离其正常值,导致线路短路或断路或改变有源组件(运算放大器)的工作特性。如果线性模拟电路的指定参数由于故障而发生变化,并且故障电路表现为线性系统,则通过补偿更改后的参数值来执行纠错。否则,可能会进行部分校正。通过添加到线性模拟电路中的少量硬件来执行错误检测和纠正。无论电路大小如何,硬件开销实际上都是恒定的,并且可以轻松地校准错误检测电路对故障的敏感性。

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