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System-level performance evaluation of three-dimensional integrated circuits

机译:三维集成电路的系统级性能评估

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In this paper, the wire (interconnect)-length distribution of three-dimensional (3-D) integrated circuits (ICs) is derived using Rent's rule and following the methodology used to estimate two-dimensional (2-D) (wire-length distribution). Two limiting cases of connectivity between logic gates on different device layers are examined by comparing the wire-length distribution and average and total wire-length. System performance metrics such as clock frequency, chip area, etc., are estimated using wire-length distribution, interconnect delay criteria, and simple models representing the cost or complexity for manufacturing 3-D ICs. The technology requirement for interconnects in 3-D integration is also discussed.
机译:在本文中,使用Rent规则并遵循用于估计二维(2-D)的方法(导线长度)来导出三维(3-D)集成电路(IC)的导线(互连)长度分布分配)。通过比较线长分布以及平均和总线长,可以检查不同器件层上逻辑门之间连通性的两种极限情况。系统性能指标(例如时钟频率,芯片面积等)使用线长分布,互连延迟标准以及代表制造3D IC的成本或复杂性的简单模型进行估算。还讨论了3D集成中互连的技术要求。

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