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Design and Sensitivity Analysis of a New Current-Mode Sense Amplifier for Low-Power SRAM

机译:新型低功耗SRAM电流模式检测放大器的设计和灵敏度分析

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A new current-mode sense amplifier is presented. It extensively utilizes the cross-coupled inverters for both local and global sensing stages, hence achieving ultra low-power and ultra high-speed properties simultaneously. Its sensing delay and power consumption are almost independent of the bit- and data-line capacitances. Extensive post-layout simulations, based on an industry standard 1 V/65-nm CMOS technology, have verified that the new design outperforms other designs in comparison by at least 27% in terms of speed and 30% in terms of power consumption. Sensitivity analysis has proven that the new design offers the best reliability with the smallest standard deviation and bit-error-rate (BER). Four 32 $times$ 32-bit SRAM macros have been used to validate the proposed design, in comparison with three other circuit topologies. The new design can operate at a maximum frequency of 1.25 GHz at 1 V supply voltage and a minimum supply voltage of 0.2 V. These attributes of the proposed circuit make it a wise choice for contemporary high-complexity systems where reliability and power consumption are of major concerns.
机译:提出了一种新的电流模式读出放大器。它在本地和全局感测阶段都广泛使用交叉耦合的反相器,因此可以同时实现超低功耗和超高速性能。它的检测延迟和功耗几乎与位线和数据线电容无关。基于行业标准1 V / 65-nm CMOS技术的广泛的布局后仿真已经证明,与之相比,新设计在速度和功耗方面至少比其他设计高出27%和30%。灵敏度分析已经证明,新设计以最小的标准偏差和误码率(BER)提供了最佳的可靠性。与其他三个电路拓扑相比,已使用四个32×32位SRAM宏来验证所提出的设计。新设计可以在1 V电源电压和0.2 V最小电源电压下以1.25 GHz的最大频率工作。提议的电路的这些属性使其成为可靠性和功耗都达到了要求的现代高复杂度系统的明智选择。主要问题。

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