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首页> 外文期刊>Very Large Scale Integration (VLSI) Systems, IEEE Transactions on >Replicating Tag Entries for Reliability Enhancement in Cache Tag Arrays
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Replicating Tag Entries for Reliability Enhancement in Cache Tag Arrays

机译:复制标签条目以提高缓存标签阵列的可靠性

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Protecting on-chip cache memories against soft errors has become an increasing challenge in designing new generation reliable microprocessors. Previous efforts have mainly focused on improving the reliability of the cache data arrays. Due to its crucial importance to the correctness of cache accesses, the tag array also demands high reliability against soft errors. Exploiting the address locality of memory accesses, we propose to duplicate most recently accessed tag entries in a small tag replication buffer (TRB) thus to protect the information integrity of the tag array in the data cache. Experimental results show that our proposed TRB scheme achieves a high 90% access-with-replica (AWR) rate with low performance ($sim$ 0%), energy (16.3%), and area (19.9%) overheads. We also conduct a detailed design space exploration for the TRB design and propose a selective TRB scheme that achieves a higher AWR rate (97.4%) for the dirty cachelines with negligible overheads. To provide a comprehensive evaluation of the tag-array reliability, we further conduct an architectural vulnerability factor (AVF) analysis for the tag array in the data cache and propose a refined metric, detected-without-replica-AVF (DOR-AVF), which combines the AVF and AWR analysis. Based on our DOR-AVF analysis, a selective TRB scheme with early write-back (S-TRB-EWB) is proposed, which achieves a zero DOR-AVF and 100% AWR rate at a negligible performance overhead. Results from statistical fault/error injection experiment also confirm the effectiveness of our TRB schemes and the achieved reliability of the cache tag array that recovers 100% of detected errors.
机译:在设计新一代可靠的微处理器时,保护片上高速缓存存储器免受软错误已成为日益严峻的挑战。先前的努力主要集中在提高高速缓存数据阵列的可靠性上。由于其对高速缓存访​​问的正确性至关重要,因此标签阵列还要求对软错误的高度可靠性。利用内存访问的地址局部性,我们建议在小标签复制缓冲区(TRB)中复制最近访问的标签条目,从而保护数据缓存中标签阵列的信息完整性。实验结果表明,我们提出的TRB方案实现了90%的高复制访问率(AWR),而性能($ sim $ 0%),能源(16.3%)和区域(19.9%)开销较低。我们还对TRB设计进行了详细的设计空间探索,并提出了一种选择性TRB方案,该方案可为脏高速缓存行以更高的开销实现更高的AWR率(97.4%)。为了提供对标签阵列可靠性的全面评估,我们还对数据缓存中的标签阵列进行了架构脆弱性因素(AVF)分析,并提出了一种改进的指标,即无副本检测到的AVF(DOR-AVF),结合了AVF和AWR分析。基于我们的DOR-AVF分析,提出了一种具有早期回写功能的选择性TRB方案(S-TRB-EWB),该方案在性能开销可忽略的情况下实现了零DOR-AVF和100%AWR率。统计故障/错误注入实验的结果还证实了我们的TRB方案的有效性以及所获得的高速缓存标签阵列的可靠性,该阵列可回收100%的检测到的错误。

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