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Design of n-Tier Multilevel Interconnect Architectures by Using Carbon Nanotube Interconnects

机译:使用碳纳米管互连设计n级多层互连体系结构

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In this paper, n-tier methodology is developed to design multilevel interconnect architecture of macrocells using single-wall carbon nanotube (SWCNT) bundles. Upper limit of low-bias voltage of SWCNT bundle interconnects is derived and its dependence on temperature, SWCNTs’ diameter, and interconnect length is studied. Possibility of using SWCNT bundles as local interconnects at 7.5-nm technology node is discussed, and it is shown that SWCNT bundles with 1 nm diameter cannot be used at the first interconnect metal level. Using Cu and SWCNT bundles, multilevel interconnect architecture of a 7.5-nm ASIC macrocell is designed which reduces the number of metal levels by 27% and power dissipation by 25% compared with the multilevel interconnect architecture designed with only Cu. The effect of aspect ratio (AR) on the n-tier design is studied. It is shown that decreasing AR of SWCNT bundle interconnects, decreases total power dissipation of the ASIC macrocell by 41%. The impact of temperature variation on the design of multilevel interconnect architecture is also investigated.
机译:在本文中,开发了n层方法,以使用单壁碳纳米管(SWCNT)束设计宏单元的多层互连体系结构。推导了SWCNT束互连的低偏置电压上限,并研究了其对温度,SWCNT直径和互连长度的依赖性。讨论了将SWCNT束用作7.5-nm技术节点处的局部互连的可能性,结果表明,直径为1 nm的SWCNT束不能在第一互连金属层使用。使用Cu和SWCNT束,设计了7.5 nm ASIC宏单元的多层互连体系结构,与仅使用Cu的多层互连体系结构相比,金属层数量减少了27%,功耗降低了25%。研究了纵横比(AR)对n层设计的影响。结果表明,减少SWCNT束互连的AR,可使ASIC宏单元的总功耗降低41%。还研究了温度变化对多层互连体系结构设计的影响。

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